采用光生伏特效应的LED芯片在检测方法上的研究(下)
上传人:李恋,李平 上传时间: 2009-12-22 浏览次数: 348 |
4 结论
针对LED封装过程巾急需解决的产品质量检测问题,基于pn结的光生伏特效应,研究了一种非接触式的LED芯片在线检测方法。通过测量pn结光生伏特效应在引线支架中产生的光生电流,检测LED封装过程中芯片质量及芯片与支架之问的连接状态,并进一步分析了pn结光生伏特效应的等效电路,详细论述了半导体材料的各种参数及等效电路中各电参数与支架上流过的光生电流的关系,以及这些参数对检测结果造成的影响。实验结果表明,对不同颜色的LED,在相同的激励条件下,由于LED材料及结构参数的不同,测量的光生电流值有很大差异。而对于相同颜色同种类型的不同LED,由于芯片本身质量或者其电气连接状态的影响,也存在一定的差异,根据这种差异就可以分析LED封装过程中芯片质量及芯片与支架之间的电气连接状态。研究表明,该方法可以实现LED芯片的在线检测,有较大的应用价值。
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作者简介
李恋,2003年于重庆大学获得学十学位,2005年至今在重庆大学攻读博士学位,主要研究方向是半导体检测。
李平。现为重庆大学光电T程教授、博士生导师,主要研究方向为传感技术、能量采集和半导体照明等。
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